PRENATA, G. D.; AHMAD RIDHOI. Reference-based degradation screening of 150-kV insulators using GWO-optimized one-class SVM under limited puncture-test data. JURNAL ELTEK, [S. l.], v. 24, n. 2, p. 80–92, 2026. DOI: 10.33795/eltek.v24i2.11136. Disponível em: https://jurnal.polinema.ac.id/index.php/eltek/article/view/11136. Acesso em: 5 nov. 2026.