Prenata, Giovanni Dimas, and Ahmad Ridhoi. “Reference-Based Degradation Screening of 150-KV Insulators Using GWO-Optimized One-Class SVM under Limited Puncture-Test Data”. JURNAL ELTEK 24, no. 2 (October 30, 2026): 80–92. Accessed November 5, 2026. https://jurnal.polinema.ac.id/index.php/eltek/article/view/11136.